
BGA96(DDR3) Socket F Solution_10X14mm_Premium,ic test socket
- Payment Type:
- paypal
- Min. Order:
- 1 Piece/Pieces
- Min. Order:
- 1 Piece/Pieces
- Delivery Time:
- 5 Days
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Contact NowPlace of Origin: | China |
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Payment Type: | paypal |
The F solution designed for test, debug, and validation of devices of BGA, LGA, QFP, QFN, SOP, etc. For devices with more than 256 pins, please look for our [U" solution.
Standardized design shorten lead time
Feature:
- F solution is designed for test, debug, and validation of devices of BGA, LGA, QFP, QFN, SOP, etc.
- The compact, surface mount design requires no tooling, no extra place or mounting holes in the target PC board, maximizing real estate while reducing board costs.
- Precision machined spring probes with industry proven solder balls ensure high reliability performance, easy of maintenance and reduced testing downtime.
- Fully removable double latch turning lid makes it can be used for both manual and automatic operation, and enable quick device insertion and extraction.
- Avoid problem of pad co-planarity, oxidation and damage of PC board after de-soldering comparing to conventional design, Provide protection to PC board from cutting through by probes.
- "Buy and use" modular design makes it no needs customer to provide PC board, protect customer's IP.
- Mechanical
- Socket Body: Peek Ceramic
- Socket Lid: AL,Cu,POM
- Contact: Spring Probe
- Solder Ball: RoHS Compliant(Lead-free) 96.5Sn/3.0Ag/0.5Cu(SAC305)
- Operation Temperature: -40ºC to 140ºC
- Life Span at Operating Travel:100K cycles Min.
- Cycles Spring Force: 20g ~ 30g per Pin
- Electrical
- Current Rating (Continuous) : 1A Min.
- DC Resistance: 100mohm Max.
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